(1) The first principles simulation technique based on TCAD in characterizing SEE induced by heavy ions,Chinese physics B,2011,第2作者
(2) Bitstream decoding and SEU-induced failure analysis in SRAM-based FPGAs.,SCIENCE CHINA: Information Sciences,2011,第3作者
(3) Experimental Study of the Single Event Upset Accumulation in SRAM-based FPGAs,IEEE Nuclear and Space Radiation Effects Conference,2010,第3作者
(4) Development of TID-aware MOSFET model and its application to SRAM circuit,The Proceedings of 10th European Conference on Radiation Effects on Components and Systems,2010,第3作者
(5) 新型微电子技术单粒子效应研究面临的挑战,核技术,2010,第1作者
(6) 亚微米特征工艺尺寸随机静态存储器单粒子效应试验研究,原子能科学技术,2010,第1作者
(7) Geant4模拟SRAM单元中子单粒子效应,原子能科学技术,2010,第2作者
(8) The Reliability and Availability Analysis of SEU Mitigation Techniques in SRAM-based FPGAs,The Proceedings of 10th European Conference on Radiation Effects on Components and Systems,2009,第3作者
(9) SRAM单粒子翻转三维数值仿真,物理学报,2009,第2作者